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Integrated Nanomanipulator With In-Process Lithography Inspection

Nanomanipulation techniques are extensively in use not only to reveal more characteristics of nano, micro and mesoscopic phenomena but also to build functional nano-devices that can bridge components between two or more scales to diversify the functions. In this paper, a novel integrated and numeric...

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Bibliografische gegevens
Hoofdauteur: Samir Mekid
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: IEEE 2020-01-01
Reeks:IEEE Access
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Online toegang:https://ieeexplore.ieee.org/document/9097243/
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