High Sensitivity Refractometer Based on TiO2-Coated Adiabatic Tapered Optical Fiber via ALD Technology

Atomic layer deposition (ALD) technology is introduced to fabricate a high sensitivity refractometer based on an adiabatic tapered optical fiber. Different thicknesses of titanium dioxide (TiO2) nanofilm were coated around the tapered fiber precisely and uniformly under different deposition cycles....

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Detalhes bibliográficos

Principais autores:	Shan Zhu, Fufei Pang, Sujuan Huang, Fang Zou, Qiang Guo, Jianxiang Wen, Tingyun Wang
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2016-08-01
coleção:	Sensors
Assuntos:	refractometer adiabatic tapered optical fiber titanium dioxide nanofilm atomic layer deposition
Acesso em linha:	http://www.mdpi.com/1424-8220/16/8/1295
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