Time domain thermoreflectance measurements and phonon gas modeling of the thermal conductivity of silicon doped indium phosphide pertinent to quantum cascade lasers
The thermal conductivity of Si-doped thin films of indium phosphide grown via metalorganic vapour-phase epitaxy at different carrier concentrations and thicknesses was measured from 80 to 450 K using time domain thermoreflectance. Additionally, phonon gas modeling was conducted to characterize the v...
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| Autors principals: | , , , , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
AIP Publishing LLC
2023-04-01
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| Col·lecció: | APL Materials |
| Accés en línia: | http://dx.doi.org/10.1063/5.0141252 |
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