Narrow-area average method for measurement of the propagation length of surface plasmon polaritons using nanoslit-grating structures

The propagation attenuation of surface plasmon polaritons (SPPs) has an important impact on the performance of plasmonic devices, so measuring their propagation length is important for designing plasmonic devices. Here we propose a method using a single nanoslit surrounded on both sides by surface g...

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Λεπτομέρειες βιβλιογραφικής εγγραφής

Κύριοι συγγραφείς:	Jianjie Dong, Xiaofeng Wang, Chen Zhang, Haiguang Yang
Μορφή:	Artigo
Γλώσσα:	Inglês
Έκδοση:	Elsevier 2023-01-01
Σειρά:	Results in Physics
Θέματα:	Surface plasmon polaritons Plasmonic devices Nanoslit Statistical averaging measurement method
Διαθέσιμο Online:	http://www.sciencedirect.com/science/article/pii/S2211379722008063
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