Narrow-area average method for measurement of the propagation length of surface plasmon polaritons using nanoslit-grating structures

The propagation attenuation of surface plasmon polaritons (SPPs) has an important impact on the performance of plasmonic devices, so measuring their propagation length is important for designing plasmonic devices. Here we propose a method using a single nanoslit surrounded on both sides by surface g...

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Detalhes bibliográficos

Principais autores:	Jianjie Dong, Xiaofeng Wang, Chen Zhang, Haiguang Yang
Formato:	Artigo
Idioma:	Inglês
Publicado em:	Elsevier 2023-01-01
Colecção:	Results in Physics
Assuntos:	Surface plasmon polaritons Plasmonic devices Nanoslit Statistical averaging measurement method
Acesso em linha:	http://www.sciencedirect.com/science/article/pii/S2211379722008063
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