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2D mapping of plane stress crack-tip fields following an overload

The evolution of crack-tip strain fields in a thin (plane stress) compact tension sample following an  overload (OL) event has been studied using two different experimental techniques. Surface behaviour has been characterised by Digital Image Correlation (DIC), while the bulk behaviour has been char...

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Autori principali: P. J. Withers, P. Lopez-Crespo, M. Mostafavi, A. Steuwer, J. F. Kelleher, T. Buslaps
Natura: Artigo
Lingua:Inglês
Pubblicazione: Gruppo Italiano Frattura 2015-06-01
Serie:Fracture and Structural Integrity
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Accesso online:https://www.fracturae.com/index.php/fis/article/view/1485
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