Yolo Based Defects Detection Algorithm for EL in PV Modules with Focal and Efficient IoU Loss

Considering the defect detection issues in electroluminescence (EL) of photovoltaic (PV) cell systems, lots of factors result in performance degradation, including defect diversity, data imbalance, scale difference, etc. Focal-EIoU loss, an effective defect detection solution for EL, is proposed bas...

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Principais autores:	Shen Ding, Wanting Jing, Hao Chen, Congyan Chen
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2024-08-01
coleção:	Applied Sciences
Assuntos:	EL defects in photovoltaic components YOLOv5 serial network Focal-EIoU loss EIoU
Acesso em linha:	https://www.mdpi.com/2076-3417/14/17/7493
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