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Investigation of Morphological, Optical, and Dielectric Properties of RF Sputtered WO<sub>x</sub> Thin Films for Optoelectronic Applications

Tungsten oxide (WO<sub>x</sub>) thin films were synthesized through the RF magnetron sputtering method by varying the sputtering power from 30 W to 80 W. Different investigations have been conducted to evaluate the variation in different morphological, optical, and dielectric properties with the spu...

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Bibliographic Details
Main Authors: Samiya Mahjabin, Md. Mahfuzul Haque, K. Sobayel, Vidhya Selvanathan, M. S. Jamal, M. S. Bashar, Munira Sultana, Mohammad Ismail Hossain, Md. Shahiduzzaman, Merfat Algethami, Sami S. Alharthi, Nowshad Amin, Kamaruzzaman Sopian, Md. Akhtaruzzaman
Format: Artigo
Language:Inglês
Published: MDPI AG 2022-10-01
Series:Nanomaterials
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Online Access:https://www.mdpi.com/2079-4991/12/19/3467
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