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Ultrathin Hafnium‐Based Ferroelectric Devices for In‐Memory Computing Applications

ABSTRACT The discovery of ferroelectricity in HfO2‐based ferroelectrics at the ultrathin scale has reignited enthusiasm for ferroelectric memory device research, propelling hafnium‐based ferroelectric devices to the forefront of nanoelectronics research. Simultaneously, the rapid advancement of big...

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Principais autores: Chenghong Mo, Zheng Wang, Jialin Meng, Tianyu Wang
Formato: Artigo
Idioma:Inglês
Publicado: Wiley 2026-03-01
Series:Information & Functional Materials
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Acceso en liña:https://doi.org/10.1002/ifm2.70010
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