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QTL for spike-layer uniformity and their influence on yield-related traits in wheat

Abstract Background Common wheat (Triticum aestivum L.) is one of the most important food crops worldwide. Wheat spike-layer uniformity related traits (SLURTs) were complex traits that directly affect yield potential and appearance. In this study, quantitative trait locus (QTL) for five SLURTs among...

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Principais autores: Chunhua Zhao, Na Zhang, Yongzhen Wu, Han Sun, Cheng Liu, Xiaoli Fan, Xuemei Yan, Hongxing Xu, Jun Ji, Fa Cui
Formato: Artigo
Idioma:Inglês
Publicado em: BMC 2019-02-01
coleção:BMC Genetics
Assuntos:
Quantitative trait locus
Recombinant inbred line
Spike-layer uniformity
Wheat
Yield
Acesso em linha:http://link.springer.com/article/10.1186/s12863-019-0730-3
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