QTL for spike-layer uniformity and their influence on yield-related traits in wheat

Abstract Background Common wheat (Triticum aestivum L.) is one of the most important food crops worldwide. Wheat spike-layer uniformity related traits (SLURTs) were complex traits that directly affect yield potential and appearance. In this study, quantitative trait locus (QTL) for five SLURTs among...

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Autores principales:	Chunhua Zhao, Na Zhang, Yongzhen Wu, Han Sun, Cheng Liu, Xiaoli Fan, Xuemei Yan, Hongxing Xu, Jun Ji, Fa Cui
Formato:	Artigo
Lenguaje:	Inglês
Publicado:	BMC 2019-02-01
Colección:	BMC Genetics
Materias:	Quantitative trait locus Recombinant inbred line Spike-layer uniformity Wheat Yield
Acceso en línea:	http://link.springer.com/article/10.1186/s12863-019-0730-3
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