Hard X-ray single-shot spectrometer of PAL-XFEL
A transmissive single-shot spectrometer has been developed to monitor shot-to-shot spectral structures in the hard X-ray beamline of the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL). The established spectrometer comprises 10 µm-thick Si crystals bent to a radius of curvature of...
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| Hauptverfasser: | , , , , , , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
International Union of Crystallography
2025-01-01
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| Schriftenreihe: | Journal of Synchrotron Radiation |
| Schlagworte: | |
| Online-Zugang: | https://journals.iucr.org/paper?S1600577524009779 |
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