Transparent memory testing based on dual address sequences
An effectiveness of the application of classical non-destructive tests for testing storage devices and their main disadvantages, among which there are great time complexity and low diagnostic ability, are analysed. The concept of double address sequence 2A is defined and the examples of their format...
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| Hlavní autoři: | , , , |
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| Médium: | Artigo |
| Jazyk: | Russo |
| Vydáno: |
Educational institution «Belarusian State University of Informatics and Radioelectronics»
2021-07-01
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| Edice: | Доклады Белорусского государственного университета информатики и радиоэлектроники |
| Témata: | |
| On-line přístup: | https://doklady.bsuir.by/jour/article/view/3107 |
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