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Van der Waals integration of 2D materials for advanced intelligent computing

The increasing demand for faster, energy-efficient, and higher bandwidth semiconductor devices has pushed conventional Si-based scaling to its fundamental limits, including mobility degradation, short-channel effects, and high power consumption. To overcome these challenges, three-dimensional integr...

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Detalhes bibliográficos
Principais autores: Chaehyeon Kwak, Keunpyo Park, Min-Kyu Song, Ho Won Jang, Jun Min Suh
Formato: Artigo
Idioma:Inglês
Publicado em: IOP Publishing 2025-01-01
Colecção:Neuromorphic Computing and Engineering
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Acesso em linha:https://doi.org/10.1088/2634-4386/ae294e
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