Investigating Floating-Gate Topology Influence on van der Waals Memory Performance

As a critical storage technology, the material selection and structural design of flash memory devices are pivotal to their storage density and operational characteristics. Although van der Waals materials can potentially take over the scaling roadmap of silicon-based technologies, the scaling mecha...

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Detalhes bibliográficos

Principais autores:	Hao Zheng, Yusang Qin, Caifang Gao, Junyi Fang, Yifeng Zou, Mengjiao Li, Jianhua Zhang
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2025-04-01
Colecção:	Nanomaterials
Assuntos:	van der Waals transistor floating-gate memory memory window electrostatic coupling
Acesso em linha:	https://www.mdpi.com/2079-4991/15/9/666
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