When Are Two Tests Better Than One? Increasing the Accuracy of Binary Classification With Repetitive Testing
Abstract Repetitive testing models for binary classification (accept or reject) have been extensively investigated in semiconductor fabrication where devices may be tested numerous times until they are accepted or ultimately scrapped. There are situations, however, where the number of tests is limit...
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| Format: | Artigo |
| Sprog: | Inglês |
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Springer
2025-03-01
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| Serier: | Journal of Statistical Theory and Applications (JSTA) |
| Fag: | |
| Online adgang: | https://doi.org/10.1007/s44199-025-00105-2 |
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