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Tohutoro APA (7th ed.)
Wieland, J. R. (2025). When Are Two Tests Better Than One? Increasing the Accuracy of Binary Classification With Repetitive Testing. Springer.
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Tohutoru Kātū Chicago (17th ed.)
Wieland, Jamie R. When Are Two Tests Better Than One? Increasing the Accuracy of Binary Classification With Repetitive Testing. Springer, 2025.
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Tohutoro MLA (9th ed.)
Wieland, Jamie R. When Are Two Tests Better Than One? Increasing the Accuracy of Binary Classification With Repetitive Testing. Springer, 2025.
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