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Measuring system for testing electrical parameters of EMCCDs of various formats

This article describes the developed equipment that allows measuring the photoelectrical parameters of multielement photodetectors, specifically various formats of EMCCD (electron multiplying charge-coupled device) chips. The authors present the measuring techniques and test results on dark currents...

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Principais autores: Viacheslav Zabudsky, Oleksandr Golenkov, Oleg Rikhalsky, Vladimir Reva, Sergij Korinets, Sergey Dukhnin
Format: Artigo
Sprog:Inglês
Udgivet: Politehperiodika 2019-12-01
Serier:Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
Fag:
photodetectors
emccd
electron multiplying charge-coupled device
measuring system
photoelectric parameters
Online adgang:https://tkea.com.ua/index.php/journal/article/view/114
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