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Low-energy cathodoluminescence microscopy for the characterization of nanostructures

Spatially and spectrally resolved low-energy cathodoluminescence (CL) microscopy was applied to the characterization of nanostructures. CL has the advantage of revealing not only the presence of luminescence centers but also their spatial distribution. The use of electrons as an excitation source al...

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Збережено в:
Бібліографічні деталі
Автор: Benjamin Dierre, Xiaoli Yuan and Takashi Sekiguchi
Формат: Artigo
Мова:Inglês
Опубліковано: Taylor & Francis Group 2010-01-01
Серія:Science and Technology of Advanced Materials
Онлайн доступ:http://iopscience.iop.org/1468-6996/11/4/043001
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