Mechanical/Electrical Characterization of ZnO Nanomaterial Based on AFM/Nanomanipulator Embedded in SEM

ZnO nanomaterials have been widely used in micro/nano devices and structure due to special mechanical/electrical properties, and its characterization is still deficient and challenging. In this paper, ZnO nanomaterials, including nanorod and nanowire are characterized by atomic force microscope (AFM...

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Autori principali:	Mei Liu, Weilin Su, Xiangzheng Qin, Kai Cheng, Wei Ding, Li Ma, Ze Cui, Jinbo Chen, Jinjun Rao, Hangkong Ouyang, Tao Sun
Natura:	Artigo
Lingua:	Inglês
Pubblicazione:	MDPI AG 2021-02-01
Serie:	Micromachines
Soggetti:	nanomanipulator atomic force microscope ZnO mechanical/electrical characterization piezoelectric property
Accesso online:	https://www.mdpi.com/2072-666X/12/3/248
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