Frustrated double ionization of argon atoms in strong laser fields
We demonstrate kinematically complete measurements on frustrated double ionization of argon atoms in strong laser fields with a reaction microscope. We found that the electron trapping probability after strong-field double ionization is much higher than that after strong-field single ionization, esp...
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| Autors principals: | , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
American Physical Society
2020-01-01
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| Col·lecció: | Physical Review Research |
| Accés en línia: | http://doi.org/10.1103/PhysRevResearch.2.013021 |
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