Frustrated double ionization of argon atoms in strong laser fields
We demonstrate kinematically complete measurements on frustrated double ionization of argon atoms in strong laser fields with a reaction microscope. We found that the electron trapping probability after strong-field double ionization is much higher than that after strong-field single ionization, esp...
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| Главные авторы: | , , , , |
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| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
American Physical Society
2020-01-01
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| Серии: | Physical Review Research |
| Online-ссылка: | http://doi.org/10.1103/PhysRevResearch.2.013021 |
| Метки: |
Нет меток, Требуется 1-ая метка записи!
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