Imaging and milling resolution of light ion beams from helium ion microscopy and FIBs driven by liquid metal alloy ion sources
While the application of focused ion beam (FIB) techniques has become a well-established technique in research and development for patterning and prototyping on the nanometer scale, there is still a large underused potential with respect to the usage of ion species other than gallium. Light ions in...
Guardat en:
| Autors principals: | , , , , , |
|---|---|
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Beilstein-Institut
2020-11-01
|
| Col·lecció: | Beilstein Journal of Nanotechnology |
| Matèries: | |
| Accés en línia: | https://doi.org/10.3762/bjnano.11.156 |
| Etiquetes: |
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|