Background Rejection in Two-Photon Fluorescence Image Scanning Microscopy
We discuss the properties of signal strength and integrated intensity in two-photon excitation confocal microscopy and image scanning microscopy. The resolution, optical sectioning and background rejection are all improved over nonconfocal two-photon microscopy. Replacing the pinhole of confocal two...
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| Principais autores: | , , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI AG
2023-05-01
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| Colecção: | Photonics |
| Assuntos: | |
| Acesso em linha: | https://www.mdpi.com/2304-6732/10/5/601 |
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