Complex illumination system for fast interferometric measurements
Freeform metrology is an enabling technology for today’s research and advanced manufacturing. The Tilted Wave Interferometer is a full field measurement system for fast and flexible measurements. It is based on an off-axis illumination scheme based on a microlens array. In this contribution, we pres...
I tiakina i:
| Ngā kaituhi matua: | , , , , |
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| Hōputu: | Artigo |
| Reo: | Inglês |
| I whakaputaina: |
EDP Sciences
2023-01-01
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| Rangatū: | EPJ Web of Conferences |
| Urunga tuihono: | https://www.epj-conferences.org/articles/epjconf/pdf/2023/13/epjconf_eosam2023_02002.pdf |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
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