Optimized Multiple-Bit-Flip Soft-Errors-Tolerant TCAM using Machine Learning
Soft errors from radiations can change the data in electronic devices especially memory cells such as in TCAMs. The soft errors cause bit-flip errors that makes the data are corrupted in the network. This paper presents a novel machine learning for a multiple-bit-flip-tolerant TCAM that address soft...
שמור ב:
| Principais autores: | , |
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| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Universitas Andalas
2022-03-01
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| סדרה: | Jurnal Nasional Teknik Elektro |
| גישה מקוונת: | https://jnte.ft.unand.ac.id/index.php/jnte/article/view/1007 |
| תגים: |
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