Electron fourier ptychography for phase reconstruction

Abstract Exit wavefunction reconstruction is important in transmission electron microscopy for structural studies. We describe electron Fourier ptychography and its application to phase reconstruction of both radiation-resistant and beam-sensitive materials. We demonstrate that the phase of the exit...

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Autors principals:	Jingjing Zhao, Chen Huang, Ali Mostaed, Amirafshar Moshtaghpour, James M. Parkhurst, Ivan Lobato, Marcus Gallagher-Jones, Judy S. Kim, Mark Boyce, David Stuart, Elena A. Andreeva, Jacques-Philippe Colletier, Angus I. Kirkland
Format:	Artigo
Idioma:	Inglês
Publicat:	Nature Portfolio 2025-10-01
Col·lecció:	Scientific Reports
Matèries:	Electron Fourier ptychography Phase reconstruction Low fluence Cryogenic condition
Accés en línia:	https://doi.org/10.1038/s41598-025-21638-7
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