Diffusion Processes And Interface Electron Scattering In Film Systems Based On Cu/Fe AND Fe/Cr
Investigation results of diffusion processes by the SIMS and the AES methods in Cu/Fe and Fe/Cr film systems are represented; influence of the annealing temperature on the effective thermal diffusion coefficients is studied. Values of the interface transmission coefficient and the effective diffusio...
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| Autors principals: | , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Sumy State University
2009-01-01
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| Col·lecció: | Журнал нано- та електронної фізики |
| Matèries: | |
| Accés en línia: | http://jnep.sumdu.edu.ua/download/numbers/2009/2/articles/en/jnep_eng_2009_V1_N2_79-89.pdf |
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