An ellipsometric approach towards the description of inhomogeneous polymer-based Langmuir layers
The applicability of nulling-based ellipsometric mapping as a complementary method next to Brewster angle microscopy (BAM) and imaging ellipsometry (IE) is presented for the characterization of ultrathin films at the air–water interface. First, the methodology is demonstrated for a vertically nonmov...
Salvato in:
| Autori principali: | , , , , |
|---|---|
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Beilstein-Institut
2016-08-01
|
| Serie: | Beilstein Journal of Nanotechnology |
| Soggetti: | |
| Accesso online: | https://doi.org/10.3762/bjnano.7.107 |
| Tags: |
Nessun Tag, puoi essere il primo ad aggiungerne!!
|