An ellipsometric approach towards the description of inhomogeneous polymer-based Langmuir layers
The applicability of nulling-based ellipsometric mapping as a complementary method next to Brewster angle microscopy (BAM) and imaging ellipsometry (IE) is presented for the characterization of ultrathin films at the air–water interface. First, the methodology is demonstrated for a vertically nonmov...
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| Autores principales: | , , , , |
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| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
Beilstein-Institut
2016-08-01
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| Colección: | Beilstein Journal of Nanotechnology |
| Materias: | |
| Acceso en línea: | https://doi.org/10.3762/bjnano.7.107 |
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