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Performance of thermal field-assisted precision lapping for single crystal sapphire wafers

To address the issues of poor surface quality and low efficiency in conventional sapphire wafer lapping processing, a thermal field-assisted processing technology was proposed. The influence of thermal field-assistance on sapphire wafer lapping performance was investigated. While controlling the tem...

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Bibliografske podrobnosti
Principais autores: Yongchao XU, Jiabao SUN, Hao ZHAN, Binjie FU, Youji ZHAN, Tianqing ZHENG
Format: Artigo
Jezik:Chinês
Izdano: Zhengzhou Research Institute for Abrasives & Grinding Co., Ltd. 2023-10-01
Serija:Jin'gangshi yu moliao moju gongcheng
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Online dostop:http://www.jgszz.cn/article/doi/10.13394/j.cnki.jgszz.2022.0203
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