Upgraded Combined Inject-and-Transfer System for Serial Femtosecond Crystallography

Serial femtosecond crystallography (SFX) using an X-ray free-electron laser (XFEL) can be applied to determine the room-temperature structure of target molecules while minimizing radiation damage and visualizing molecular dynamics. In SFX, a sample delivery system is required to deliver microcrystal...

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Principais autores:	Keondo Lee, Donghyeon Lee, Jaehyun Park, Jong-Lam Lee, Wan Kyun Chung, Yunje Cho, Ki Hyun Nam
Formato:	Artigo
Idioma:	Inglês
Publicado:	MDPI AG 2022-09-01
Series:	Applied Sciences
Assuntos:	serial femtosecond crystallography X-ray free-electron laser BITS sample chamber fixed-target injection
Acceso en liña:	https://www.mdpi.com/2076-3417/12/18/9125
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