Damage before destruction? X-ray-induced changes in single-pulse serial femtosecond crystallography

Serial femtosecond crystallography (SFX) exploits extremely brief X-ray free-electron laser pulses to obtain diffraction data before destruction of the crystal. However, during the pulse X-ray-induced site-specific radiation damage can occur, leading to electronic state and/or structural changes. He...

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التفاصيل البيبلوغرافية

المؤلفون الرئيسيون:	Lewis J. Williams, Amy J. Thompson, Philipp Dijkstal, Martin Appleby, Greta Assmann, Florian S. N. Dworkowski, Nicole Hiller, Chia-Ying Huang, Tom Mason, Samuel Perrett, Eduard Prat, Didier Voulot, Bill Pedrini, John H. Beale, Michael A. Hough, Jonathan A. R. Worrall, Robin L. Owen
التنسيق:	Artigo
اللغة:	Inglês
منشور في:	International Union of Crystallography 2025-05-01
سلاسل:	IUCrJ
الموضوعات:	xfels radiation damage pulse duration serial femtosecond crystallography
الوصول للمادة أونلاين:	https://journals.iucr.org/paper?S2052252525002660
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!