Damage before destruction? X-ray-induced changes in single-pulse serial femtosecond crystallography

Serial femtosecond crystallography (SFX) exploits extremely brief X-ray free-electron laser pulses to obtain diffraction data before destruction of the crystal. However, during the pulse X-ray-induced site-specific radiation damage can occur, leading to electronic state and/or structural changes. He...

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Autors principals:	Lewis J. Williams, Amy J. Thompson, Philipp Dijkstal, Martin Appleby, Greta Assmann, Florian S. N. Dworkowski, Nicole Hiller, Chia-Ying Huang, Tom Mason, Samuel Perrett, Eduard Prat, Didier Voulot, Bill Pedrini, John H. Beale, Michael A. Hough, Jonathan A. R. Worrall, Robin L. Owen
Format:	Artigo
Idioma:	Inglês
Publicat:	International Union of Crystallography 2025-05-01
Col·lecció:	IUCrJ
Matèries:	xfels radiation damage pulse duration serial femtosecond crystallography
Accés en línia:	https://journals.iucr.org/paper?S2052252525002660
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