Spectroscopic Ellipsometry Studies and Temperature Behaviour of the Dielectric Function of TlInS2 Layered Crystal

Real and imaginary parts of the dielectric function of TlInS2 single crystals in the spectral range from 1 to 5 eV were determined within a temperature range of 133–293 K from spectroscopic ellipsometry measurements. The energies of interband transitions (critical points) for TlInS2 were obtained...

Ausführliche Beschreibung

Bibliografische Detailangaben

Hauptverfasser:	O.O.В Gomonnai, O.В Gordan, P.P.В Guranich, P.В Huranich, A.G.В Slivka, A.V.В Gomonnai, D.R.T.В Zahn
Format:	Artigo
Sprache:	Inglês
Veröffentlicht:	Sumy State University 2017-10-01
Schriftenreihe:	Журнал нано- та електронної фізики
Schlagworte:	Dielectric function Optical transitions Structural phase transition
Online-Zugang:	http://jnep.sumdu.edu.ua:8080/download/numbers/2017/5/articles/Proof_JNEP_05025.pdf
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