Spectroscopic Ellipsometry Studies and Temperature Behaviour of the Dielectric Function of TlInS2 Layered Crystal
Real and imaginary parts of the dielectric function of TlInS2 single crystals in the spectral range from 1 to 5 eV were determined within a temperature range of 133–293 K from spectroscopic ellipsometry measurements. The energies of interband transitions (critical points) for TlInS2 were obtained...
Wedi'i Gadw mewn:
| Prif Awduron: | , , , , , , |
|---|---|
| Fformat: | Artigo |
| Iaith: | Inglês |
| Cyhoeddwyd: |
Sumy State University
2017-10-01
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| Cyfres: | Журнал нано- та електронної фізики |
| Pynciau: | |
| Mynediad Ar-lein: | http://jnep.sumdu.edu.ua:8080/download/numbers/2017/5/articles/Proof_JNEP_05025.pdf |
| Tagiau: |
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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