Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy

Abstract Piezoelectric and ferroelectric materials have garnered significant interest owing to their excellent physical properties and multiple potential applications. Accordingly, the need for evaluating piezoelectric and ferroelectric properties has also increased. The piezoelectric and ferroelect...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй

Үндсэн зохиолчид:	Owoong Kwon, Daehee Seol, Huimin Qiao, Yunseok Kim
Формат:	Artigo
Хэл сонгох:	Inglês
Хэвлэсэн:	Wiley 2020-09-01
Цуврал:	Advanced Science
Нөхцлүүд:	conductive atomic force microscopy ferroelectricity piezoelectricity piezoresponse force microscopy scanning probe microscopy
Онлайн хандалт:	https://doi.org/10.1002/advs.201901391
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!