Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications
Abstract Neuromorphic systems require integrated structures with high-density memory and selector devices to avoid interference and recognition errors between neighboring memory cells. To improve the performance of a selector device, it is important to understand the characteristics of the switching...
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| Principais autores: | , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
SpringerOpen
2021-05-01
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| coleção: | Applied Microscopy |
| Assuntos: | |
| Acesso em linha: | https://doi.org/10.1186/s42649-021-00056-9 |
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