MDT: A simple tool to facilitate dropcasting on in situ TEM MEMS chips
In situ transmission electron microscopy with holders based on the use of micro-electromechanical systems provides valuable insights into material kinetics, yet sample preparation remains complex due to fragile silicon nitride (Si3N4) windows and the risk of leaks and contamination during dropcastin...
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| 主要な著者: | , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Elsevier
2025-09-01
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| シリーズ: | HardwareX |
| 主題: | |
| オンライン･アクセス: | http://www.sciencedirect.com/science/article/pii/S2468067225000446 |
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