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Investigation of Inner Spacer-Less Nanosheet FETs From an Off-State Current Perspective

Recently, silicon nanosheet (NS) field-effect transistors (FETs) with a gate-all-around (GAA) structure have been introduced into the semiconductor industry for 3-nm-node logic technology. Compared to the planar or tri-gate structures, the GAA structure provides strong gate controllability, which su...

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Autori principali: Hyo-Jun Park, Moon-Kwon Lee, Eui-Cheol Yun, Dol Sohn, Min-Woo Kim, Sang-Min Kang, Hyuntak Jeon, Jun-Young Park
Natura: Artigo
Lingua:Inglês
Pubblicazione: IEEE 2025-01-01
Serie:IEEE Access
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Accesso online:https://ieeexplore.ieee.org/document/11259063/
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