Tender X-ray diffraction anomalous fine structure spectroscopy applied to the study of PbSc0.5Nb0.5O3 relaxor ferroelectric oxide

Diffraction anomalous fine structure spectroscopy (DAFS) is a well established technique for characterizing the local structure of elements embedded in complex interfaces and templates when crystallographic and/or site selectivity is needed. DAFS has been effectively applied in the hard X-ray range,...

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Hlavní autoři:	G. Ciatto, Y. Bing, Z.-G. Ye, P.-E. Janolin
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	International Union of Crystallography 2025-11-01
Edice:	Journal of Synchrotron Radiation
Témata:	diffraction anomalous fine structure spectroscopy tender x-ray relaxor ferroelectric oxides superstructure reflections chemical order
On-line přístup:	https://journals.iucr.org/paper?S1600577525007428
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