Tender X-ray diffraction anomalous fine structure spectroscopy applied to the study of PbSc0.5Nb0.5O3 relaxor ferroelectric oxide

Diffraction anomalous fine structure spectroscopy (DAFS) is a well established technique for characterizing the local structure of elements embedded in complex interfaces and templates when crystallographic and/or site selectivity is needed. DAFS has been effectively applied in the hard X-ray range,...

Ful tanımlama

Kaydedildi:
Detaylı Bibliyografya
Asıl Yazarlar: G. Ciatto, Y. Bing, Z.-G. Ye, P.-E. Janolin
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: International Union of Crystallography 2025-11-01
Seri Bilgileri:Journal of Synchrotron Radiation
Konular:
diffraction anomalous fine structure spectroscopy
tender x-ray
relaxor ferroelectric oxides
superstructure reflections
chemical order
Online Erişim:https://journals.iucr.org/paper?S1600577525007428
Etiketler: Etiketle
Etiket eklenmemiş, İlk siz ekleyin!

Benzer Materyaller