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Effect of hydrogenation on type II silicon clathrate films

In this study we investigate for the first time the effect of hydrogenation on the properties of type II silicon clathrate films (SiCL). These clathrates are an alternative form of silicon based on a cage structure. It can be either emptied or filled with sodium atoms, leading to a metallic or semic...

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Hoofdauteurs: Maxime Hanauer, Anil Kumar Bharwal, Yongfeng Tong, Brahim Aissa, Charif Tamin, Jeéreémy Bartringer, Stéphane Roques, Dominique Muller, Céline Chevalier, Aziz Dinia, Abdelilah Slaoui, Thomas Fix
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: IOP Publishing 2025-01-01
Reeks:JPhys Energy
Onderwerpen:
silicon clathrate films
plasma hydrogenation
ToF-SIMS
chemical depth profiling
ERDA
energy levels
Online toegang:https://doi.org/10.1088/2515-7655/ae0368
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