Unanticipated Interfacial Redox Reaction in the NiOx Transport Layer of Perovskite Light‐Emitting Diodes

Abstract This study reveals an unanticipated interfacial redox reaction between the nickel oxide (NiOx) hole transport layer and perovskite active layer in organolead halide perovskite light‐emitting diodes (PeLEDs). Specifically, metallic nickel (Ni0) present in the NiOx layer undergoes oxidation w...

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Autores principales:	Thi‐Hoai Do, Aswaghosh Loganathan, Yun‐Han Wu, Yaw‐Shyan Fu, Tzung‐Fang Guo
Formato:	Artigo
Lenguaje:	Inglês
Publicado:	Wiley 2026-02-01
Colección:	Advanced Science
Materias:	bias‐induced performance metallic lead NiOx/perovskite interface oxidation‐reduction reaction
Acceso en línea:	https://doi.org/10.1002/advs.202510824
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