Oak-YOLO: A high-performance detection model for automated Oak seed defect identification.
Oak seeds are highly susceptible to pest infestations due to their elevated starch content, which significantly impairs germination and subsequent growth. To address this challenge, we developed a high-resolution imaging system and proposed an improved YOLO-based model named Oak-YOLO for efficient a...
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| Hlavní autoři: | , , , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Public Library of Science (PLoS)
2025-01-01
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| Edice: | PLoS ONE |
| On-line přístup: | https://doi.org/10.1371/journal.pone.0327371 |
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