YOLO-WWBi: An Optimized YOLO11 Algorithm for PCB Defect Detection

The manufacturing quality of printed circuit boards (PCBs) significantly influences the functionality and life expectancy of electronic devices. This paper introduces a YOLO-WWBi based on improved YOLO11 framework method for the detection of surface defects. First, an improved weighted and re-parame...

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Hlavní autoři:	Yi Zhao, Zhidi Jiang
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	IEEE 2025-01-01
Edice:	IEEE Access
Témata:	YOLO11 defect detection PCB deep learning
On-line přístup:	https://ieeexplore.ieee.org/document/10977983/
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