Time-resolved force microscopy using the delay-time modulation method

We developed a time-resolved force microscopy technique by integrating atomic force microscopy using a tuning-fork-type cantilever with the delay time modulation method for optical pump-probe light. We successfully measured the dynamics of surface recombination and diffusion of photoexcited carriers...

詳細記述

書誌詳細

主要な著者:	Hiroyuki Mogi, Rin Wakabayashi, Shoji Yoshida, Yusuke Arashida, Atsushi Taninaka, Katsuya Iwaya, Takeshi Miura, Osamu Takeuchi, Hidemi Shigekawa
フォーマット:	Artigo
言語:	Inglês
出版事項:	IOP Publishing 2024-01-01
シリーズ:	Applied Physics Express
主題:	time-resolved AFM SPM ultrashort pulse laser ultrafast dynamics nanoscale science
オンライン･アクセス:	https://doi.org/10.35848/1882-0786/ad0c04
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