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Time-resolved force microscopy using the delay-time modulation method

We developed a time-resolved force microscopy technique by integrating atomic force microscopy using a tuning-fork-type cantilever with the delay time modulation method for optical pump-probe light. We successfully measured the dynamics of surface recombination and diffusion of photoexcited carriers...

Täydet tiedot

Tallennettuna:
Päätekijät: Hiroyuki Mogi, Rin Wakabayashi, Shoji Yoshida, Yusuke Arashida, Atsushi Taninaka, Katsuya Iwaya, Takeshi Miura, Osamu Takeuchi, Hidemi Shigekawa
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: IOP Publishing 2024-01-01
Sarja:Applied Physics Express
Aiheet:
time-resolved AFM
SPM
ultrashort pulse laser
ultrafast dynamics
nanoscale science
Linkit:https://doi.org/10.35848/1882-0786/ad0c04
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