QR kód

In-Depth Review of YOLOv1 to YOLOv10 Variants for Enhanced Photovoltaic Defect Detection

This review presents an investigation into the incremental advancements in the YOLO (You Only Look Once) architecture and its derivatives, with a specific focus on their pivotal contributions to improving quality inspection within the photovoltaic (PV) domain. YOLO’s single-stage approach to object...

Celý popis

Uloženo v:
Hlavní autoři: Muhammad Hussain, Rahima Khanam
Médium: Artigo
Jazyk:Inglês
Vydáno: MDPI AG 2024-06-01
Edice:Solar
Témata:
computer vision
convolutional neural networks
deep learning
object detection
photovoltaic
quality inspection: manufacturing
On-line přístup:https://www.mdpi.com/2673-9941/4/3/16
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!

Podobné jednotky