In-Depth Review of YOLOv1 to YOLOv10 Variants for Enhanced Photovoltaic Defect Detection
This review presents an investigation into the incremental advancements in the YOLO (You Only Look Once) architecture and its derivatives, with a specific focus on their pivotal contributions to improving quality inspection within the photovoltaic (PV) domain. YOLO’s single-stage approach to object...
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| Autors principals: | , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
MDPI AG
2024-06-01
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| Col·lecció: | Solar |
| Matèries: | |
| Accés en línia: | https://www.mdpi.com/2673-9941/4/3/16 |
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